Absolute Entfernung messendes Interferometer mit fester Wellenlänge
Anmelder: Mitutoyo Corporation 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP2418456
- Aktenzeichen
- EP11177104
- Anmeldetag
- 10. August 2011
- Veröffentlichung
- 27. März 2013
- Erteilung
- 27. März 2013
- Rechtsraum
- EP
- IPC
- G01B9/02G01B11/02
Abstract
A fixed wavelength absolute distance interferometer including a first interferometer comprising a first light source transmitting a first light beam having a wavelength W toward a measurement target, a wavefront radius detector configured to provide a first measurement responsive to the wavefront radius at the wavefront radius detector, and a first path length calculating portion calculating a coarse resolution absolute path length measurement R; and a second interferometer comprising a beam transmitting device transmitting a second-interferometer light beam having a wavelength A, a beam splitting/combining device separating the second-interferometer light beam into reference and measurement beams and combining the returning reference and measurement beams into a combined beam, a second-interferometer detector configured to receive the combined beam and provide signals of a phase Õ of the combined beam, and a second path length calculating portion configured to determine a medium resolution absolute path length measurement Z M .
Anmelder
- Firma
- Mitutoyo Corporation
- Land
- 🇯🇵 Japan
Mitutoyo ist ein japanischer Hersteller von Präzisionsmessgeräten mit Sitz in Kawasaki. Die Patente betreffen Messtechnik, Koordinatenmessgeräte und Sensorik.
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