Zeitbereichssuchen bei einem Prüf- und Messinstrument
Anmelder: Tektronix, Inc. 🇺🇸
Details
- Veröffentlichungs-Nr.
- EP2418496
- Aktenzeichen
- EP11250722
- Anmeldetag
- 12. August 2011
- Veröffentlichung
- 6. Oktober 2021
- Erteilung
- 6. Oktober 2021
- Rechtsraum
- EP
- IPC
- G01R13/02G01R23/16
Abstract
Embodiments of the invention include devices and methods for searching IQ-based time-domain traces for events, marking the events, and analyzing intervals of interest at or around the events on a display unit of a test and measurement instrument. The test and measurement instrument (100) can include an input terminal (110) to receive an RF signal, an ADC (108) to digitize the RF signal, a digital downconverter (115) to produce I (in-phase) and Q (quadrature) baseband component information from the digitized RF signal, an acquisition memory (130) to acquire and store a record, a trace generation section (145) to generate one or more IQ-based time-domain traces, and a search unit (147) to scan the IQ-based time-domain traces for one or more events. The search unit can locate and mark the events for display on a display unit of the test and measurement instrument.
Anmelder
- Firma
- Tektronix, Inc.
- Land
- 🇺🇸 USA
Fachgebiete
-
HGF
HGF · München
-
Brinck, David John Borchardt
NoneLondon