Messreihenanalyseverfahren von elektromagnetischen Wellen
EP2426838
Art B1
19. Juni 2019
Anmelder: Alcatel Lucent, ALCATEL LUCENT 🇫🇷
Details
- Veröffentlichungs-Nr.
- EP2426838
- Aktenzeichen
- EP11178515
- Anmeldetag
- 23. August 2011
- Veröffentlichung
- 19. Juni 2019
- Erteilung
- 19. Juni 2019
- Rechtsraum
- EP
- IPC
- H04B17/00
Abstract
The method involves decomposing courses in series of segments (202-i-1, 202-i, 202-i+1) defined by departure geographical positions (204-i-1, 204-i, 204, i+1) and arrival geographical positions (206-i-1, 206-i, 206-i+1), and associating electromagnetic waves receiving global measurements (20) to the segments, where the measurements are obtained from measurements carried out during courses in series of segments. The measurements of electromagnetic waves of a circuit (200) are analyzed by comparing global measurements of the identical segments. An independent claim is also included for a series of electromagnetic waves measurements.
Anmelder
- Firmen
- Alcatel Lucent
ALCATEL LUCENT - Land
- 🇫🇷 Frankreich
Fachgebiete
Vertreten von
Sciaux, Edmond
Boulogne-Billancourt, Frankreich
1.072
Patente gesamt
23
Fachgebiete
10
Anmelder-Länder
Schwerpunkte
Weitere Vertreter
-
Cabinet Camus Lebkiri
Cabinet Camus Lebkiri · Paris
-
Nicolle, Olivier
NoneColombes