Elektronisches Abstandsmessverfahren und elektronisches Abstandsmessinstrument

EP2541274 Art B1 23. April 2014

Anmelder: Kabushiki Kaisha Topcon 🇯🇵

Details

Veröffentlichungs-Nr.
EP2541274
Aktenzeichen
EP12174494
Anmeldetag
29. Juni 2012
Veröffentlichung
23. April 2014
Erteilung
23. April 2014
Rechtsraum
EP
IPC
G01S17/10G01S7/497G01S7/486G01B9/02
Offizieller Volltext

Abstract

An electronic distance measuring instrument comprises a distance measuring optical path (13), an internal reference optical path (10), a pulsed light emitting light source (5) for emitting a pulsed light, a pulsed light guiding means for directing the pulsed light emitted from the pulsed light source toward the distance measuring optical path as a distance measuring pulsed light and for directing the pulsed light toward the internal reference optical path as an internal reference pulsed light, a photodetector (6) for detecting the distance measuring pulsed light and the internal reference pulsed light and emitting a photodetection signal, and a measuring unit (4) for calculating the distance to an object to be measured based on the photodetection signal from the photodetector. The electronic distance measuring instrument is arranged to perform a coarse distance measurement based on the difference in the photodetection time between the internal reference pulsed light and the distance measuring pulsed light reflected from the object to be measured, to carry out a Fourier function transform on the photodectection waveform of the internal reference pulsed light outputted by the photodetector and the photodetection waveform of the distance measuring pulsed light, respectively to separate the waveforms into a plurality of frequency components, to obtain the phase difference for each of the frequency components acquired, to perform a fine distance measurement based on the time difference acquired from the phase difference and to measure the distance to the object to be measured by adding the result of the coarse distance measurement to the result of the fine distance measurement.

Anmelder

Firma
Kabushiki Kaisha Topcon
Land
🇯🇵 Japan
🇯🇵 Kabushiki Kaisha Topcon

Topcon ist ein japanischer Hersteller von Mess-, Vermessungs- und ophthalmologischen Geräten sowie Positionierungstechnik. Das Patentportfolio konzentriert sich auf Mess-, Prüf- und Zeitmesstechnik sowie Medizintechnik und Gesundheit, ergänzt durch Software und Optik. Anmeldungen erstrecken sich von 2000 bis 2017.

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