Verfahren und Vorrichtung zum Messen der Winkellage eines emittierenden oder reflektierenden Objekts mit hoher Schärfe

Details

Veröffentlichungs-Nr.

EP2664890

Aktenzeichen

EP12305554

Anmeldetag

18. Mai 2012

Veröffentlichung

30. Oktober 2019

Erteilung

30. Oktober 2019

Rechtsraum

EP

IPC

G01B11/26G01B11/02G01B17/00

Abstract

The invention concerns a method for measuring the relative angular position of an object (E) and an angular position measuring device (10) comprising at least a first and a second transducers (D1, D2) delimiting respectively a first and a second reception fields, the first and second reception fields overlapping in area defined as the field of view of the device (10), the method comprising the following steps: a) carrying out an amplitude modulation of the signals delivered by the first and the second transducers (D1, D2); and b) calculating an output signal (A) starting from the amplitude modulated signals (Ph1, Ph2) delivered by the first and the second transducers (D1, D2) as a function of said relative angular position, characterized in that step a) is done by receiving radiation (M), whose intensity is modulated in time at a known frequency, from said object (E) with said transducers (D1, D2) within the field of view.

Anmelder

Firmen

Université d'Aix-Marseille
Centre National de la Recherche Scientifique (C.N.R.S.)
Centre National de la Recherche Scientifique (C.N.R.S)

Land

🇫🇷 Frankreich

Fachgebiete