Halbleitervorrichtung mit oberflächenintegriertem Fokussierelement

Details

Veröffentlichungs-Nr.

EP2908341

Aktenzeichen

EP14155574

Anmeldetag

18. Februar 2014

Veröffentlichung

11. Juli 2018

Erteilung

11. Juli 2018

Rechtsraum

EP

IPC

H01L27/146H01L31/0203

Abstract

The semiconductor device comprises a semiconductor substrate (1), a sensor or sensor array (2) arranged at a main surface (10) of the substrate, an integrated circuit (3) arranged at or above the main surface, and a focusing element (4) formed within a further main surface (11) of the substrate opposite the main surface. The focusing element is preferably arranged opposite the sensor or sensor array (2), which may be a photosensor or photodetector or an array of photosensors or photodetectors, for instance.

Anmelder

Firma

ams AG

Land

🇦🇹 Österreich

Fachgebiete