Halbleiterbauelement, Diagnosetest und Diagnosetestschaltung

Details

Veröffentlichungs-Nr.

EP2930524

Aktenzeichen

EP15163316

Anmeldetag

13. April 2015

Veröffentlichung

23. August 2017

Erteilung

23. August 2017

Rechtsraum

EP

IPC

G01R31/3185G01R31/3177G06F11/08

Abstract

Deterioration in operation performance due to a fault diagnosis is prevented. A semiconductor device (90) according to the present invention includes a plurality of CPU cores (91 to 94) each including a scan chain, and a diagnostic test circuit (95) that performs a scan test for the plurality of CPU cores (91 to 94) by using the scan chain of the CPU core. The diagnostic test circuit (95) performs a scan test for each of the plurality of CPU cores (91 to 94) in a predetermined order on a periodic basis so that execution time periods of the scan tests do not overlap each other.

Anmelder

Firma

Renesas Electronics Corporation

Land

🇯🇵 Japan

Fachgebiete