Speichervorrichtung mit Datengültigkeitskontrolle

Details

Veröffentlichungs-Nr.

EP3043350

Aktenzeichen

EP15199840

Anmeldetag

14. Dezember 2015

Veröffentlichung

11. Januar 2017

Rechtsraum

EP

IPC

G11C5/00G11C7/24G11C29/24G11C29/52G11C16/34G11C7/14

Abstract

A memory device (10) for storing data includes a memory cell (14) and a test cell (16). The memory cell (14) is configured to indicate a data value based on a threshold voltage of the memory cell (14). The test cell (16) is configured to indicate a validity rating of the data value stored in the memory cell (14). The validity rating is determined after exposure to an environmental condition such as high temperatures and/or X-ray radiation. The validity rating is based on a test shift (22) from an initial threshold voltage of the test cell (16) prior to exposure to the environmental condition to a shifted threshold voltage of the test cell (16) after exposure to the environmental condition. The validity rating is characterized as invalid when the test shift (22) is greater than a threshold value.

Anmelder

Firma

Delphi Technologies, Inc.

Land

🇺🇸 USA

Fachgebiete