Nachprüfung der Datenintegrität in einem Datenverarbeitungssystem

Details

Veröffentlichungs-Nr.

EP3098816

Aktenzeichen

EP16169875

Anmeldetag

17. Mai 2016

Veröffentlichung

31. Juli 2019

Erteilung

31. Juli 2019

Rechtsraum

EP

IPC

G11C16/34G11C29/50G11C29/52G11C7/20G11C29/42

Abstract

A memory system includes a memory array, control circuitry, and comparator circuitry. The memory array includes a first section having a first plurality of programmed bitcells having a first threshold voltage distribution and a second section having a second plurality of programmed bitcells having a second threshold voltage distribution which has a lower average threshold voltage than the first threshold voltage distribution. The first plurality and second plurality of programmed bitcells are programmed with a same set of data values. The control circuitry is configured to provide a read request to the memory array and receive read data in response to the read request, wherein the read data comprises first read data from the first section and second read data from the second section. The comparator circuitry is configured to compare the first read data to the second read data and generate an error indicator in response to the compare.

Anmelder

Firmen

NXP USA, Inc.
Freescale Semiconductor, Inc.

Land

🇺🇸 USA

Fachgebiete