Verfahren zur Glättung der Oberfläche einer Struktur
Anmelder: Soitec 🇫🇷
Details
- Veröffentlichungs-Nr.
- EP3193355
- Aktenzeichen
- EP17150008
- Anmeldetag
- 2. Januar 2017
- Veröffentlichung
- 13. November 2019
- Erteilung
- 13. November 2019
- Rechtsraum
- EP
- IPC
- H01L21/324// H01L21/762
Abstract
The invention relates to a process for smoothing a silicon-on-insulator structure comprising the exposure of a surface of the structure to an inert or reducing gas flow and to a high temperature during a heat treatment, the process comprising: • a first heat treatment step at a first temperature and under a first gas flow defined by a first flow rate; the process being noteworthy in that it comprises: • a second heat treatment step at a second temperature lower than the first temperature and under a second gas flow defined by a second flow rate lower than the first flow rate.
Anmelder
- Firma
- Soitec
- Land
- 🇫🇷 Frankreich
Französischer Halbleiterhersteller mit Sitz in Bernin, spezialisiert auf Silicon-on-Insulator (SOI) Substrate. Patente decken Halbleitermaterialien und Waferbondtechnik ab.
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