Halbleiterbauelement, Halbleitersystem und Steuerungsverfahren eines Halbleiterbauelements

Details

Veröffentlichungs-Nr.

EP3301541

Aktenzeichen

EP17185297

Anmeldetag

8. August 2017

Veröffentlichung

6. Mai 2020

Erteilung

6. Mai 2020

Rechtsraum

EP

IPC

G06F1/26G06F1/28G01R31/28H03K5/133G06F1/24H03K3/03

Abstract

An object of the present invention is to provide a semiconductor device, a semiconductor system, and a control method of a semiconductor device capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.

Anmelder

Firma

Renesas Electronics Corporation

Land

🇯🇵 Japan

Fachgebiete