Testmustererzeugungsverfahren, Testmuster, Druckvorrichtung und Programm

Details

Veröffentlichungs-Nr.

EP3363642

Aktenzeichen

EP18157945

Anmeldetag

21. Februar 2018

Veröffentlichung

30. März 2022

Erteilung

30. März 2022

Rechtsraum

EP

IPC

B41J2/21B41J19/14

Abstract

A test pattern is formed by selecting at least three parts from among parts for measuring an impact displacement due to print head displacement between first and second print heads, an impact displacement due to chip displacement between first and second chips, an impact displacement due to round-trip displacement between a forward pass and a reverse pass of main scanning, an impact displacement due to column displacement between first and second nozzle columns, an impact displacement due to position displacement of the first print head around a main scanning direction, and position displacement of the first print head, and an impact displacement due to position displacement of the first print head around a direction orthogonal to the main scanning direction and a direction intersecting with the main scanning direction. The test pattern has a length in a sub scanning direction less than that of the head. The at least three parts are arranged in the sub scanning direction.

Anmelder

Firma

Seiko Epson Corporation

Land

🇯🇵 Japan

Fachgebiete