Halbleiterbauelement und Verfahren zur Timing-Kalibrierung

Details

Veröffentlichungs-Nr.

EP3382713

Aktenzeichen

EP18165131

Anmeldetag

29. März 2018

Veröffentlichung

19. Juli 2023

Erteilung

19. Juli 2023

Rechtsraum

EP

IPC

G11C29/02G11C29/56

Abstract

When the same processing as initial training is executed to cope with fluctuation in the timing of a signal, the performance of a semiconductor device utilizing the relevant memory is degraded. A delay adjustment circuit adjusts a delay amount of write data to a memory device. A control circuit sets a delay amount of the delay adjustment circuit. A storage unit stores a delay amount. The control circuit corrects the delay amount stored in the storage unit based on a writing result of write data obtained when the delay amount stored in the storage unit or an amount based on that delay amount is set on the delay adjustment circuit.

Anmelder

Firma

Renesas Electronics Corporation

Land

🇯🇵 Japan

Fachgebiete