Kanonenlinsendesign in einem Ladungsträgerteilchenmikroskop
Anmelder: FEI Company 🇺🇸
Details
- Veröffentlichungs-Nr.
- EP3399537
- Aktenzeichen
- EP18170249
- Anmeldetag
- 1. Mai 2018
- Veröffentlichung
- 16. Oktober 2019
- Erteilung
- 16. Oktober 2019
- Rechtsraum
- EP
- IPC
- H01J37/065H01J37/067H01J37/145// H01J37/28
Abstract
A charged particle microscope comprising: - A vacuum enclosure (2) ; - A source (4) for producing a beam of charged particles; - A specimen holder (H) for holding a specimen; - An illuminator, provided between said source and specimen holder, and comprising in a propagation direction of said beam: ª A source lens (8a, 8b); ª A condenser system (10); - A detector (22) for detecting radiation emanating from the specimen in response to irradiation by said beam, wherein said source lens is a compound lens, comprising in said propagation direction: - A magnetic lens (8a) comprising permanent magnets (16) disposed outside said vacuum enclosure but produce a magnetic field within it; - A variable electrostatic lens (8b).
Anmelder
- Firma
- FEI Company
- Land
- 🇺🇸 USA
US-amerikanischer Hersteller von Elektronenmikroskopen und wissenschaftlichen Bildgebungssystemen, seit 2016 Teil von Thermo Fisher Scientific. Patente betreffen Elektronen- und Ionenmikroskopie sowie Materialanalyse.
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