Verfahren zur Herstellung einer Halbleiterschaltvorrichtung

EP3404722 Art B1 24. März 2021

Anmelder: NXP B.V. 🇳🇱

Details

Veröffentlichungs-Nr.
EP3404722
Aktenzeichen
EP17171514
Anmeldetag
17. Mai 2017
Veröffentlichung
24. März 2021
Erteilung
24. März 2021
Rechtsraum
EP
IPC
H01L29/66H01L21/266H01L29/78H01L29/08H01L29/10
Offizieller Volltext

Abstract

A semiconductor switch device and a method of making the same. The method includes providing a semiconductor substrate having a major surface and a first semiconductor region having a first conductivity type. The method further includes implanting ions into the first semiconductor region through an opening in a mask positioned over the first semiconductor region, thereby to form a well region located in the first semiconductor region, the well region having a second conductivity type different to the first conductivity type. The method also includes depositing and patterning a gate electrode material on a gate dielectric to form a gate electrode located directly above the well region. The method further includes performing ion implantation to form a source region located in the well region on a first side of the gate, and to form a drain region located outside the well region on a second side of the gate.

Anmelder

Firma
NXP B.V.
Land
🇳🇱 Niederlande
🇳🇱 NXP Semiconductors

Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.

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