Fehlererkennung in Registern
Anmelder: NXP B.V. 🇳🇱
Details
- Veröffentlichungs-Nr.
- EP3428665
- Aktenzeichen
- EP17180696
- Anmeldetag
- 11. Juli 2017
- Veröffentlichung
- 25. März 2020
- Erteilung
- 25. März 2020
- Rechtsraum
- EP
- IPC
- G01R31/3181G01R31/3185G11C29/56G11C29/34G11C29/44G11C29/12G11C29/32
Abstract
A method of detecting faults in a register bank, the register bank comprising at least one chain of registers, is disclosed. The method comprises sequentially shifting parameters stored in each register of the chain to an output node of the chain and inverting each parameter and feeding each parameter back to an input node of that chain, and sequentially shifting the inverted parameters through the chain until all the non-inverted parameters have been output at the output node. A first checksum of the parameters output at the output node is calculated. The inverted parameters in each register of the chain are sequentially shifted to the output node of the chain, and each inverted parameter is inverted to restore the non-inverted parameters, feeding each non-inverted parameter back to the input node of that chain and sequentially shifting the non-inverted parameters through the chain until all the inverted parameters have been output at the output node. A second checksum of the inverted parameters output at the output node is calculated, and the first and second checksums are compared.
Anmelder
- Firma
- NXP B.V.
- Land
- 🇳🇱 Niederlande
Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.
7.918 Patente in unserer Datenbank
-
Lee, Candice Jane
NXP SEMICONDUCTORS · Redhill