Vorrichtung zur Elektromagnetischen Strukturcharakterisierung
Anmelder: NXP B.V. 🇳🇱
Details
- Veröffentlichungs-Nr.
- EP3488778
- Aktenzeichen
- EP18206595
- Anmeldetag
- 15. November 2018
- Veröffentlichung
- 19. Juli 2023
- Erteilung
- 19. Juli 2023
- Rechtsraum
- EP
- IPC
- A61B5/05A61B5/053G01N27/02H04B5/00// A61B5/0205A61B5/08
Abstract
One example discloses a device for electromagnetic structural characterization, including: a controller having an electromagnetic transmitter output and a communications interface; wherein the controller is configured to send a signal over the electromagnetic transmitter output that causes an electromagnetic transmitter to generate a first electrical field (E1) and a first magnetic field (HI); wherein the controller configured to receive over the communications interface a second electric field (E2) and a second magnetic field (H2) received by an electromagnetic receiver; wherein the first electrical field and the first magnetic field correspond to when the electromagnetic transmitter is at a first location proximate to a structure and the second electrical field and the second magnetic field correspond to when the electromagnetic receiver is at a second location proximate to the structure; and wherein the controller is configured to calculate an impedance based on the electric and magnetic fields interacting with the structure.
Anmelder
- Firma
- NXP B.V.
- Land
- 🇳🇱 Niederlande
Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.
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