Verfahren und Vorrichtung zur Verarbeitung von Punktwolkendaten

EP3715783 Art B1 26. März 2025

Anmelder: Topcon Corporation 🇯🇵

Details

Veröffentlichungs-Nr.
EP3715783
Aktenzeichen
EP20162366
Anmeldetag
11. März 2020
Veröffentlichung
26. März 2025
Erteilung
26. März 2025
Rechtsraum
EP
IPC
G01C7/04G06T7/579G06T7/77G06T3/40G06V20/56
Offizieller Volltext

Abstract

[Object] To provide a point cloud data processing method capable of easily extracting an analysis target from entire circumference point cloud data acquired by a measuring device that is moving along a measurement route. [Solution Means] A trajectory of a measuring device 20 is calculated based on measurement data acquired by the measuring device that is moving along a measurement route, and on a vertical plane orthogonal to the trajectory, a two-dimensional figure is identified by designating an extraction angle range around an intersection P of the trajectory and the vertical plane based on a perpendicular drawn down to a horizontal plane from the intersection and an extraction distance range based on the intersection P on the vertical plane, and a region obtained by extending the two-dimensional figure along the trajectory is set as an extraction region, and point cloud data in a region including a specific analysis target is extracted as extracted point cloud data from entire circumference point cloud data acquired by scanning the circumference of the measuring device and included in the measurement data.

Anmelder

Firma
Topcon Corporation
Land
🇯🇵 Japan
🇯🇵 Topcon

Japanisches Technologieunternehmen mit Sitz in Tokio. Topcon entwickelt Präzisionsmessgeräte, GPS- und Vermessungstechnik sowie optische Instrumente für Bauwesen, Landwirtschaft und Augenheilkunde.

710 Patente in unserer Datenbank

Noch Fragen?

Wir helfen Ihnen gerne weiter. Schreiben Sie uns einfach.

Kontakt aufnehmen