Integrierte Schaltung und Messverfahren
Anmelder: NXP B.V. 🇳🇱
Details
- Veröffentlichungs-Nr.
- EP3786912
- Aktenzeichen
- EP19193888
- Anmeldetag
- 27. August 2019
- Veröffentlichung
- 6. Dezember 2023
- Erteilung
- 6. Dezember 2023
- Rechtsraum
- EP
- IPC
- G08B13/26G01R27/26G08B13/24G08B29/04// G01D5/24G09F3/03
Abstract
In accordance with a first aspect of the present disclosure, an integrated circuit (204) is provided, comprising a current source (206) and a reference capacitor (208), the integrated circuit being configured to: inject, using said current source, a first current in an external measurement capacitor (202) and determine a first amount of time within which a resulting voltage on the measurement capacitor reaches a voltage threshold; inject, using said current source, a second current in the reference capacitor and determine a second amount of time within which a resulting voltage on the reference capacitor reaches said voltage threshold; detect a change of the capacitance on the measurement capacitor using a difference between the first amount of time and the second amount of time. In accordance with a second aspect of the present disclosure, a corresponding measurement method is conceived.
Anmelder
- Firma
- NXP B.V.
- Land
- 🇳🇱 Niederlande
Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.
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