Temperaturmessschaltung mit mehreren Verteilten Kleinen Temperatursensoren mit Geringer Leistung

Details

Veröffentlichungs-Nr.

EP4053524

Aktenzeichen

EP21160754

Anmeldetag

4. März 2021

Veröffentlichung

17. April 2024

Erteilung

17. April 2024

Rechtsraum

EP

IPC

G01K1/02G01K3/08G01K7/01G01K15/00H01L27/146

Abstract

A temperature measurement circuit integrated in a semiconductor chip (20) having a plurality of local temperature sensors (10), and a central processing unit (1) connected to the plurality of local temperature sensors (10) via respective integrated wiring structures (15) in the semiconductor chip (20). The central processing unit (1) has a control logic unit (2) and an analog-to-digital converter, ADC, circuit (4-8) for providing digital measurement output data. The control logic unit (2) is connected to the ADC circuit (4-8) and arranged to select one or more of the plurality of local temperature sensors (10) and execute a measurement cycle for the selected one or more of the plurality of local temperature sensors (10). Optionally, a central temperature sensor (11) is provided as part of the central processing unit (1) to improve accuracy of the temperature measurements.

Anmelder

Firmen

Shenzhen Goodix Technology Co., Ltd.
Dream Chip Technologies B.V.

Land

🇨🇳 China

Fachgebiete