Probenanalysegerät, Probenanalyseverfahren und Programm

Details

Veröffentlichungs-Nr.

EP4246123

Aktenzeichen

EP23162048

Anmeldetag

15. März 2023

Veröffentlichung

19. November 2025

Erteilung

19. November 2025

Rechtsraum

EP

IPC

G01N15/14// G01N15/00

Abstract

Disclosed is a specimen analyzer for analyzing an analyte in a specimen, the specimen analyzer including: a measurement unit including a plurality of first sample preparation parts each configured to prepare a first measurement sample on the basis of the specimen and a first reagent, a second sample preparation part configured to prepare a second measurement sample on the basis of the specimen and a second reagent, and an optical detection part configured to obtain a first optical signal from the first measurement sample and obtain a second optical signal from the second measurement sample; and an analysis unit configured to analyze first data that corresponds to the first optical signal and second data that corresponds to the second optical signal, wherein the analysis unit executes analysis of a first measurement item with respect to the first measurement sample, through a first analysis operation of processing the first data according to an artificial intelligence algorithm, executes analysis of a second measurement item with respect to the first measurement sample, through at least one of the first analysis operation and a second analysis operation of processing a first representative value, of the first data, that corresponds to a feature of the analyte, and executes analysis with respect to the second measurement sample, through a third analysis operation of processing a second representative value, of the second data, that corresponds to a feature of the analyte.

Anmelder

Firma

SYSMEX CORPORATION

Land

🇯🇵 Japan

Fachgebiete