Verfahren und Vorrichtung zur On-Chip-Kapazitätsmessung

Details

Veröffentlichungs-Nr.

EP4283314

Aktenzeichen

EP23172479

Anmeldetag

10. Mai 2023

Veröffentlichung

23. April 2025

Erteilung

23. April 2025

Rechtsraum

EP

IPC

G01R27/26G01R35/00G01R31/28

Abstract

An on-chip capacitance measurement method and associated systems and devices are provided. Embodiments described herein rely on using the capacitor under test in an on-chip relaxation oscillator configuration whose charging/discharging currents, supply voltage, and output frequency are measured individually in a measurement block. The voltage thresholds of the relaxation oscillation are calculated from the circuit elements and the measured supply voltage. Because the oscillation frequency of the relaxation oscillator is a function of the capacitance under test, the charging/discharging currents, and the supply voltage (via voltage thresholds), the capacitance under test can be calculated using the measured values of the other quantities. Embodiments described herein provide an accurate, low-power, small-area on-chip system capable of measuring capacitance with high accuracy. An algorithm employing the above method and apparatus for tuning a crystal oscillator is also provided. Relevant circuit implementations used in the on-chip measurement system are also disclosed.

Anmelder

Firma

Qorvo US, Inc.

Land

🇺🇸 USA

Fachgebiete