Verfahren zur Modifizierung eines Testprofils in einer Chipkarte, Entsprechende Chipkarte, Testverfahren und Vorrichtung

Details

Veröffentlichungs-Nr.

EP4340418

Aktenzeichen

EP23193855

Anmeldetag

29. August 2023

Veröffentlichung

29. Oktober 2025

Erteilung

29. Oktober 2025

Rechtsraum

EP

IPC

H04W8/20H04W4/60

Abstract

Method for modifying a test profile in an integrated circuit card, in particular an embedded UICC, (108), to test an apparatus (10), in particular a device, hosting said integrated circuit card (108), said method comprising using as test profile a generic test profile (GTP) stored in said integrated circuit card (108) comprising an Elementary File Test file (EFT) containing information for updating files in order to support apparatus test operations and a test applet (TAP) configured to perform said updating on files of said generic test profile (GTP), said test applet (TAP) being configured to perform an update operation (335) on contents of a target elementary file (TGF) with a determined file identifier (<File Id>), storing in a record of the Elementary File Test file (EFT) information to perform said operation of update ((<File Path>), <data to be updated>), said information to perform said operation of update in a record of the Elementary File Test file (EFT) ((<File Path>), <data to be updated>) comprising a file path (<File Path>) identifying the position of said target elementary file (TGF) with a determined file identifier (<File Id>) in the file system (FS) of the Elementary File Test file (EFT), obtained as the concatenation of a respective parent file identifier in the file system (FS) of the Elementary File Test file (EFT) followed by the target Elementary File (TGF) file identifier (<File Id>), data to be updated <data to be updated>) built as comprising a first type of data (SD) corresponding to significant data, preceded by a length indication of the first type of data (SD), and a second type of data corresponding not significant data, represented as a filling pattern (FP), in particular preceded by length indication of the second type of data (SD), reading (330) by the Test Applet (TAP) said information to perform said operation of update in a record of the Elementary File Test file (EFT) ((<File Path>), <data to be updated>) stored, performing (335) said operation of update by selecting the target elementary file (TGF) in the file system (FS) of the Elementary File Test file (EFT) by said file path (<File Path>) and updating its content with said significant data (DS) and said filling pattern (FP) used in one or more instances to fill the target elementary file (TGF) until the end of its size.

Anmelder

Firma

STMicroelectronics S.r.l.

Land

🇮🇹 Italien

Fachgebiete