Verfahren und Vorrichtung zur Verwendung von Strahlungsbildgebungsdaten zur Analyse von Komponenten

Details

Veröffentlichungs-Nr.

EP4459272

Aktenzeichen

EP24174169

Anmeldetag

3. Mai 2024

Veröffentlichung

6. November 2024

Rechtsraum

EP

IPC

G01N23/2055

Abstract

An example method includes obtaining one or more three dimensional computer models that model geometric and material properties of a component (12), and model beam properties of a beam (16) of radiation to be applied to the component (12); utilizing the one or more three dimensional computer models to obtain simulated radiation imaging data, which includes simulated elastic scattering data, resulting from a simulated application of the beam (16) having the beam properties on a plurality of discretized samples (82) of the component (12), and which accounts for sequential interactions of rays of the beam (16) with multiple ones of the plurality of discretized samples (82); obtaining actual radiation imaging data, which includes actual elastic scattering data, of an output beam pattern (20) caused by application of a non-simulated beam (16) of radiation having the beam properties to the component (12); and performing at least one of: determining whether an anomaly exists in a crystalline structure of the component (12) based a comparison of the simulated elastic scattering data to the actual elastic scattering data; and modifying the actual radiation imaging data based on the simulated elastic scattering data to at least partially remove the actual elastic scattering data from the actual radiation imaging data. A corresponding system (10) is also disclosed.

Anmelder

Firma

RTX Corporation

Land

🇺🇸 USA

Fachgebiete