Speicherintegrierter Selbsttest (mbist) und Bist-Adaptiver Port (bap) für Periodische In-Feld-Tests

Details

Veröffentlichungs-Nr.

EP4579666

Aktenzeichen

EP24214032

Anmeldetag

19. November 2024

Veröffentlichung

2. Juli 2025

Rechtsraum

EP

IPC

G11C29/16G11C29/44G11C29/52// G11C29/18G11C29/46G11C29/04

Abstract

A BIST (built-in self-test) adaptive port (BAP) interface enables an in-field MBIST (memory BIST). The BAP enables non-destructive testing of the memory locations. The BAP includes registers to store contents of the memory device during the in-field MBIST on the memory device. The BAP can store the starting address of the next infield periodic testing and operational data from a selected memory address in the registers while the MBIST controller performs the test on the memory address. The system can then restore the operational contents of the memory after the test is complete.

Anmelder

Firma

INTEL Corporation

Land

🇺🇸 USA

Fachgebiete