System und Verfahren zur Kalibrierung eines Bearbeitungssystems

Details

Veröffentlichungs-Nr.

EP4624083

Aktenzeichen

EP25167465

Anmeldetag

31. März 2025

Veröffentlichung

1. Oktober 2025

Rechtsraum

EP

IPC

B23H7/20G01B21/04G05B19/401

Abstract

A machining system (20) includes a WEDM assembly (22), a probe assembly, a calibration artifact (66), and a controller. The WEDM assembly (22) includes a conductive wire. The conductive wire extends between and to an upper guide head and a lower guide head. The probe assembly includes a touch probe (46). The calibration artifact (66) includes an artifact body (68) forming a probe cavity (82) and a wire cavity (84). The controller is configured to identify a probe X-position and a probe Y-position of the touch probe (46) by controlling the WEDM assembly (22) to move the touch probe (46) to contact the calibration artifact (66) with the touch probe (46) disposed within the probe cavity (82), identify a wire X-position and a wire Y-position of the conductive wire by controlling the WEDM assembly (22) to move the conductive wire to contact the calibration artifact (66) with the conductive wire disposed within the wire cavity (84), and calibrate the machining system (20) by determining an X-offset and a Y-offset of the conductive wire relative to the touch probe and storing the X-offset and the Y-offset.

Anmelder

Firma

Pratt & Whitney Canada Corp.

Land

🇨🇦 Kanada

Fachgebiete