Physikalisch Bewusste Leistungsprofiloptimierung Während eines Speichertests

Details

Veröffentlichungs-Nr.

EP4648052

Aktenzeichen

EP25173859

Anmeldetag

1. Mai 2025

Veröffentlichung

12. November 2025

Rechtsraum

EP

IPC

G11C5/14G11C29/08G11C29/10G11C29/26

Abstract

A method for physical-aware power profile optimization during memory test includes creating a plurality of scheduling buckets, wherein each scheduling bucket includes one or more sequentially executed test sequences, each test sequence controlled by a respective Built-In Self-Test (BIST) controller, each test sequence including a respective unoptimized start time and a respective execution time, and a respective combined duration of the execution times of each respective scheduling bucket being less than or equal to a test time budget. A power profile is optimized by determining a respective optimized start time of at least one test sequence from at least a physical distance between two groups of memories controlled by respective BIST controllers. The respective optimized start time is assigned to the at least one test sequence.

Anmelder

Firma

NXP USA, Inc.

Land

🇺🇸 USA

Fachgebiete