Opto-Elektronisches Abtast-Messgerät und Verfahren mit Temperaturkompensation

Details

Veröffentlichungs-Nr.

EP4711709

Anmeldetag

11. September 2024

Veröffentlichung

18. März 2026

Rechtsraum

EP

IPC

G01C15/00, G01S17/89(CRAMER PETER G et al.)

Abstract

The invention relates to a method and opto-electronic scanning measuring instrument (1) for in-line compensation of thermal influences on the opto-electronic scanning measuring instrument (1) by adapting a set of instrument's parameters associated with a defined reference thermal state of the instrument (1) in dependence on an actually measured thermal state of the instrument (1), sensed by thermal sensors (6a-6d) of the instrument (1), and calculating the respective object point coordinate based on the compensated parameter set.

Anmelder

Firma

Leica Geosystems AG

Land

🇨🇭 Schweiz