Dickenmesssystem
Anmelder: Kabushiki Kaisha Toshiba 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP4711807
- Anmeldetag
- 10. Juli 2025
- Veröffentlichung
- 18. März 2026
- Rechtsraum
- EP
Abstract
According to one arrangement, a thickness measurement system includes a support base on which a measurement object is placed, a first antenna module, a second antenna module disposed opposite to the first antenna module in a first direction across the support base, and a signal generation module shared by the first antenna module and the second antenna module. Both the first antenna module and the second antenna module are configured to transmit a first signal based on a signal from the signal generation module to the measurement object and receive the first signal reflected by the measurement object. The support base, the first antenna module, and the second antenna module are installed such that a distance along the first direction between the support base and the first antenna module is different from a distance along the first direction between the support base and the second antenna module.
Anmelder
- Firma
- Kabushiki Kaisha Toshiba
- Land
- 🇯🇵 Japan
Japanischer Konzern, der Elektronik, Halbleiter, Energie- und Infrastrukturtechnik sowie Industrieanlagen entwickelt und herstellt.
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Vertreten von
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Hoffmann Eitle
Hoffmann Eitle · München