Inspektionsvorrichtung
Anmelder: Hamamatsu Photonics K.K. 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP4729931
- Anmeldetag
- 24. Juni 2024
- Veröffentlichung
- 24. April 2025
- Rechtsraum
- EP
- IPC
- G01N21/89
Abstract
An inspection device 1 for detecting foreign matter F, which is a transparent substance, in an object S comprises: an irradiation unit 3 configured to irradiate the object S with inspection light L0 including a plurality of wavelengths; a spectroscopic detection unit 4 configured to detect light L1 from an irradiation position R of the inspection light L0 in the object S and output a spectroscopic spectrum D indicating luminance of each wavelength at the irradiation position R; and a determination unit 5 configured to determine presence or absence of the foreign matter F at the irradiation position R based on information about periodicity of the spectroscopic spectrum D.
Anmelder
- Firma
- Hamamatsu Photonics K.K.
- Land
- 🇯🇵 Japan
Japanisches Unternehmen für Photonik mit Sitz in Hamamatsu, spezialisiert auf Photodetektoren, Bildsensoren, Laser und optische Messtechnik für Wissenschaft und Industrie.
1.968 Patente in unserer Datenbank