Automatische Analysevorrichtung und Waschverfahren für eine Abgabesonde
Anmelder: HITACHI HIGH-TECH CORPORATION 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP4733770
- Anmeldetag
- 10. Mai 2024
- Veröffentlichung
- 26. Dezember 2024
- Rechtsraum
- EP
- IPC
- G01N35/10
Abstract
An inner surface of a dispensing probe is efficiently washed with a heated washing liquid by suppressing heat dissipation of the heated washing liquid. An automatic analysis device includes a dispensing probe, a special washing tank 27 for supplying a heated washing liquid 307, a syringe pump 205 that aspirates a sample 303 and the heated washing liquid 307 into the dispensing probe, and a control unit that controls an operation of the syringe pump 205. When aspirating the sample 303 into the dispensing probe, the control unit causes the syringe pump 205 to aspirate the segmenting air 301 into the dispensing probe, aspirate the sample 303 following the segmenting air 301, and when aspirating the heated washing liquid 307 into the dispensing probe, aspirate the segmenting air 306 larger in amount than the segmenting air 301 into the dispensing probe and aspirate the heated washing liquid 307 following the segmenting air 306.
Anmelder
- Firma
- HITACHI HIGH-TECH CORPORATION
- Land
- 🇯🇵 Japan
Japanisches Unternehmen der Hitachi-Gruppe, spezialisiert auf Analysegeräte, medizinische Diagnostik und Fertigungsanlagen für die Halbleiterindustrie.
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