Vorrichtung zum Kalibrieren eines Röntgensystems, Röntgengerät und Verfahren zum Kalibrieren eines Röntgengeräts

Details

Veröffentlichungs-Nr.

EP4741810

Anmeldetag

8. November 2024

Veröffentlichung

13. Mai 2026

Rechtsraum

EP

IPC

G01N23/04(CHEN YUMEI et al.)(UNIV TSINGHUA et al.)

Abstract

A device (100) for calibrating an X-ray system (200) with an X-ray source (210) and an X-ray detector (220), the calibration device (100) comprising a set of at least two X-ray absorptive elements (1, 2), each element (1, 2) extending in a longitudinal (LO) and in a lateral (LA) direction, is according to the invention characterized in that the device (100) is configured to enable adjustment of the position of each element (1, 2) along a closed curve (C₁, C₂) in a plane that extends transverse to the lateral direction (LA) and in parallel to the longitudinal direction (LO) so that elements (1, 2) in each of a first and a second subset (10, 20) of the set of elements (1, 2) are positioned with their longitudinal directions (LO) aligned in an alignment direction transverse to the curve (C₁, C₂), and wherein a first total length in the longitudinal direction (LO) of the elements (1, 2) of the first subset (10) is different from a second total length in the longitudinal direction (LO) of the elements (1, 2) of the second subset (20).

Anmelder

Firma

Mettler-Toledo, LLC

Land

🇺🇸 USA

Fachgebiete