Analysevorrichtung und Verfahren zur Bestimmung der Anwesenheit oder Abwesenheit von Anomalien
Anmelder: HITACHI HIGH-TECH CORPORATION 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP4749275
- Anmeldetag
- 28. Juni 2024
- Veröffentlichung
- 23. Januar 2025
- Rechtsraum
- EP
Abstract
To provide an analyzing apparatus and a method of determining an abnormality capable of detecting abnormalities including defects and deterioration of replaceable components based on a potential difference generated between an ion selective electrode and a reference electrode, in an analyzing apparatus that measures a concentration of electrolytes in a sample, a waveform acquisition unit associates the acquired waveforms with each of driving timings, detects a peak of a waveform that appears in temporal vicinity of the driving timing, and calculates a feature amount. Here, the feature amount includes at least one of the electromotive force at the peak or a time period between a time of the driving timing and a time of occurrence of the peak. Then, the waveform analyzing unit determines an abnormality based on the feature amount (refer to Fig. 4).
Anmelder
- Firma
- HITACHI HIGH-TECH CORPORATION
- Land
- 🇯🇵 Japan
Japanisches Unternehmen der Hitachi-Gruppe, spezialisiert auf Analysegeräte, medizinische Diagnostik und Fertigungsanlagen für die Halbleiterindustrie.
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