System und Verfahren zur Inspektion einer Komponente mittels Infrarotthermographie

Details

Veröffentlichungs-Nr.

EP4752540

Anmeldetag

1. Dezember 2025

Veröffentlichung

3. Juni 2026

Rechtsraum

EP

Abstract

Systems (38; 138) and methods (1000; 2000; 3000) for inspecting components (12) with thermography are provided. The systems (38; 138) and methods (1000; 2000; 3000) facilitate the selection of thermography parameters (45) for a particular inspection situation. A method (1000; 2000; 3000) includes executing a machine learning algorithm (70A, 70B) to determine one or more thermography parameters (45) based on one or more characteristics (37) of the component (12), and performing a thermographic inspection according to the one or more thermography parameters (45). The thermographic inspection includes exciting the component (12) to induce a thermal response in a region of the component (12) containing a defect (22), and acquiring a thermographic image (46) of the region of the component containing the defect (22).

Anmelder

Firma

Pratt & Whitney Canada Corp.

Land

🇨🇦 Kanada