Testtongenerator und Verfahren dafür
Anmelder: NXP B.V. 🇳🇱
Details
- Veröffentlichungs-Nr.
- EP4753157
- Anmeldetag
- 29. November 2024
- Veröffentlichung
- 3. Juni 2026
- Rechtsraum
- EP
- IPC
- H04B1/28
Abstract
A test tone generator (467) for a receiver (356) comprises a dual-modulus divider circuit (415) arranged to receive a local oscillator, LO (367), and generate a tone therefrom in a series of pulses (417) at an offset frequency from the LO signal; at least one counter (420) connected to an output of the dual-modulus divider circuit and arranged to count a number of pulses (417) and reset the dual-modulus divider circuit when a count threshold is reached. A tone shaping circuit (430) converts the series of pulses into an output test tone (432) The dual-modulus divider circuit (415) and tone shaping circuit in combination are arranged to generate a test tone from the series of pulses at an offset frequency from the LO signal, that does not contain frequency content at an image frequency.
Anmelder
- Firma
- NXP B.V.
- Land
- 🇳🇱 Niederlande
Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.
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