System zur Bestimmung der Welligkeit eines Geförderten Dünnfilms

Details

Veröffentlichungs-Nr.

EP4760203

Anmeldetag

20. Februar 2025

Veröffentlichung

28. August 2025

Rechtsraum

EP

Abstract

The present disclosure relates to a system for determining waviness of a thin film, which has a predetermined size in a width direction and extends in the longitudinal direction, caused by tension acting on the thin film and non-uniformity of a thin film material in a roll-to-roll inline apparatus that transports the thin film in the longitudinal direction. The system includes: a lateral displacement sensor installed at one or more of both sides of the thin film in the width direction to be spaced apart from the surface of the thin film and configured to measure a displacement of the thin film surface; and a waviness determination unit for converting the lateral displacement value of the thin film surface according to time measured by the lateral displacement sensor into a magnitude value according to a frequency signal and comparing the converted magnitude value with a preset magnitude value according to the frequency signal to determine the presence or absence of waviness in the thin film.

Anmelder

Firma

LG Chem, Ltd.

Land

🇰🇷 Südkorea