Bearbeitungskomponente unter Verwendung von Abtastdaten von Internen Artefakten

Details

Veröffentlichungs-Nr.

EP4760423

Anmeldetag

11. Dezember 2025

Veröffentlichung

17. Juni 2026

Rechtsraum

EP

IPC

G05B19/402

Abstract

A method of manufacture is provided during which a component (20') with an external artifact (54) and an internal artifact (42) is scanned using a computed tomography machine (58) to provide scan data. The internal artifact (42) is disposed within an interior of the component (20'). External artifact data and internal artifact data are determined based on the scan data. The external artifact data is indicative of a physical characteristic of the external artifact (54). The internal artifact data is indicative of a physical characteristic of the internal artifact (42). A first external coordinate system is registered for the component (20') based on the external artifact data. An internal reference feature is registered for the component (20') based on the internal artifact data. Manufacturing data is provided for the component (20'). The internal reference feature is located within the first external coordinate system during the providing of the manufacturing data. A feature is formed into the component (20') using the manufacturing data.

Anmelder

Firma

RTX Corporation

Land

🇺🇸 USA