Von Unten nach Oben Verlaufende Plattierung von Kontaktlöchern durch Glas
Anmelder: Intel Corporation 🇺🇸
Details
- Veröffentlichungs-Nr.
- EP4766144
- Anmeldetag
- 17. Oktober 2025
- Veröffentlichung
- 24. Juni 2026
- Rechtsraum
- EP
- IPC
- H10W70/692, H10W70/63
Abstract
Various techniques, as well as related devices and methods, for performing metallization of through-glass vias (TGVs) in glass substrates using bottom-up plating are disclosed. A first technique is based on using subtractive etch. A second technique is based on using modified semi-additive process. A third technique is based on using flowable materials to fill a cavity in a glass substrate alongside performing bottom-up plating. Any of these techniques may further be modified by including a liner on sidewalls of TGVs to serve as a buffer layer between the glass substrate and conductive material(s) in the TGVs.
Anmelder
- Firma
- Intel Corporation
- Land
- 🇺🇸 USA
US-amerikanischer Halbleiterhersteller mit Sitz in Kalifornien. Entwickelt und produziert Prozessoren, Chipsätze sowie weitere Halbleiterkomponenten für Computer, Server und eingebettete Systeme.
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