Testschaltung und -Verfahren sowie Elektronische Vorrichtung

Details

Veröffentlichungs-Nr.

EP4781905

Anmeldetag

26. Juli 2024

Veröffentlichung

24. April 2025

Rechtsraum

EP

IPC

A61B5/024

Abstract

This application provides a test circuit and method, and an electronic device. The test circuit has a small volume and low costs, which is conducive to miniaturization of the electronic device, and is conducive to reducing costs of the electronic device. The test circuit includes: a light-emitting assembly, configured to emit at least two types of optical signals, where the at least two types of optical signals include a first optical signal and a second optical signal; and the first optical signal and the second optical signal have different wavelengths; and an optical proximity sensor, configured to collect a first optical reference signal and a second optical reference signal that are reflected and/or scattered by a human body, where the first optical reference signal and the second optical reference signal are used for calculating a human body feature value.

Anmelder

Firma

Honor Device Co., Ltd.

Land

🇨🇳 China

Fachgebiete