Verfahren zur Schätzung einer Innentemperatur einer Lithium-Ionen-Zelle

EP4786935 5. August 2026

Anmelder: CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement 🇨🇭

Details

Veröffentlichungs-Nr.
EP4786935
Anmeldetag
31. Januar 2025
Veröffentlichung
5. August 2026
Rechtsraum
EP
IPC
G01K7/26, G01K15/00
Offizieller Volltext

Abstract

Method of estimating an internal temperature of a lithium-ion cell (1), comprising steps of: a) carrying out an electrochemical impedance spectroscopy measurement on said cell (1) at a known internal temperature so as to determine a phase of impedance at a plurality of electrochemical impedance spectroscopy frequencies; b) carrying out a distribution of relaxation times analysis on said electrochemical impedance spectroscopy measurement; c) determining a characteristic frequency corresponding to an electrochemical impedance spectroscopy frequency associated with movement of lithium ions through a solid electrolyte interface layer of said cell, on the basis of said distribution of relaxation times analysis; d) providing a correlation curve representative of the relationship between the impedance phase at said characteristic frequency and internal temperature for said cell (1), and carrying out a calibration of said correlation curve on the basis of said impedance phase as measured in step a) at said characteristic frequency and said known internal temperature; e) repeatedly, carrying out electrochemical impedance spectroscopy at said characteristic frequency to determine an impedance phase at said characteristic frequency; f) on the basis of said impedance phase at said characteristic frequency as determined out in step e), estimating said internal temperature based on said correlation curve as calibrated in step d); g) repeatedly, updating said characteristic frequency and updating said calibration by repeating steps a)-d).

Anmelder

Firma
CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement
Land
🇨🇭 Schweiz
🇨🇭 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement

CSEM Centre Suisse d'Electronique et de Microtechnique ist ein Schweizer Forschungsinstitut für Mikrotechnik, Elektronik und angewandte Wissenschaften. Der Patentbestand konzentriert sich auf Mess- und Prüftechnik sowie Halbleiter-, Medizin- und Optiktechnik.

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