Verfahren und Vorrichtung mit Anomaliedetektion

Details

Veröffentlichungs-Nr.

EP4790636

Anmeldetag

14. Januar 2026

Veröffentlichung

12. August 2026

Rechtsraum

EP

IPC

G06T5/60, G06T5/70, G06T7/00

Abstract

A method to be executed by processing circuitry comprising one or more processors, a memory, an encoder and a decoder. The method includes inputting a measured image into an encoder, obtaining a feature produced from the encoder as a noise-invariant feature, passing the noise-invariant feature to a decoder, obtaining an image produced by the decoder as a denoised image, and detecting a local anomaly of the measured image by using the noise-invariant feature. The method may involve detecting one or more of a shape anomaly, a particle anomaly, and a crack anomaly for the measured image by using the noise-invariant feature. Further, the method may involve detecting a global anomaly in the measured image by using the denoised image.

Anmelder

Firma

Samsung Electronics Co., Ltd

Land

🇰🇷 Südkorea

Fachgebiete