Systeme und Verfahren für Taktile Profilometrie
Anmelder: General Electric Company 🇺🇸
Details
- Veröffentlichungs-Nr.
- EP4800349
- Anmeldetag
- 26. Februar 2026
- Veröffentlichung
- 2. September 2026
- Rechtsraum
- EP
- IPC
- G01B11/24, G01B5/20
Abstract
Provided herein are systems and methods for preforming tactile profilometry. In some aspects, a system (100) for performing tactile profilometry includes a probe (290) (102) with a profilometry sensor apparatus (108). The profilometry sensor apparatus (108) comprises a touch medium (120) having a first side (176A) adjacent to the surface (106) being inspected and a second side (176B) opposite the first side (176A), the second side (176B) having a reflective layer (136). The profilometry sensor apparatus (108) also includes a first light source (124) coupled to a first deformable waveguide (126) to illuminate the reflective layer (136) of the touch medium (120) with a first light beam at a first incidence angle and a light sensor (122) to detect reflected light. A first shaping actuator (128) is operatively coupled to the first deformable waveguide (126) to displace the first deformable waveguide (126). A controller (150) is configured to receive optical data (158) from the light sensor (122) and operate the first shaping actuator (128) to adjust the first incidence angle based on the optical data (158).
Anmelder
- Firma
- General Electric Company
- Land
- 🇺🇸 USA
US-amerikanischer Technologiekonzern mit Sitz in Massachusetts. Historisch aktiv in Energieerzeugung, Luftfahrttriebwerken, Medizintechnik und Industrietechnik über verschiedene Geschäftsbereiche.
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