Optische Inspektionsvorrichtung, Optisches Inspektionssystem, Optisches Inspektionsverfahren und Optisches Inspektionsprogramm
Anmelder: KABUSHIKI KAISHA TOSHIBA, Toshiba Information Systems (Japan) Corporation 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP4803889
- Anmeldetag
- 18. September 2025
- Veröffentlichung
- 9. September 2026
- Rechtsraum
- EP
- IPC
- G01N21/88
Abstract
In an approach, an optical inspection apparatus includes: an imaging portion and an illumination portion. The imaging portion acquires a plurality of images by repeatedly photographing an object on an optical axis of the imaging portion, the object moving relative to the optical axis in a moving direction that is a predetermined axial direction, in such a manner as to cross the optical axis. The illumination portion radiates, in a plane including the optical axis of the imaging portion and the moving direction, at a time of imaging by the imaging portion, first illumination light at a first object point on a surface of the object, and second illumination light traveling in a direction different from the first illumination light at a second object point different from the first object point, a distribution of the first illumination light and the second illumination light being asymmetric in the plane.
Anmelder
- Firmen
- KABUSHIKI KAISHA TOSHIBA
Toshiba Information Systems (Japan) Corporation - Land
- 🇯🇵 Japan
Japanischer Konzern, der Elektronik, Halbleiter, Energie- und Infrastrukturtechnik sowie Industrieanlagen entwickelt und herstellt.
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Hoffmann Eitle
Hoffmann Eitle · München