Trägervorrichtung und Teilchenstrahlvorrichtung und Optische Inspektionsvorrichtung damit
Anmelder: Hitachi High-Tech Corporation 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP4811417
- Anmeldetag
- 16. März 2026
- Veröffentlichung
- 23. September 2026
- Rechtsraum
- EP
Abstract
A stage device capable of preventing elastic deformation of a stage, and a charged particle beam apparatus and an optical inspection apparatus including the same are provided. The stage device includes: a stage configured to hold a sample; a horizontal drive unit configured to drive the stage in a horizontal direction; a vertical drive unit configured to drive the stage in a vertical direction; and a control unit configured to control the horizontal drive unit and the vertical drive unit. The control unit inverts phases of the horizontal drive unit and the vertical drive unit at a specific frequency calculated based on a frequency property when the stage is driven in the horizontal direction and a frequency property when the stage is driven in the vertical direction.
Anmelder
- Firma
- Hitachi High-Tech Corporation
- Land
- 🇯🇵 Japan
Japanisches Unternehmen der Hitachi-Gruppe, spezialisiert auf Analysegeräte, medizinische Diagnostik und Fertigungsanlagen für die Halbleiterindustrie.
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