Herstellung von Testkomponenten mit künstlichen Defekten zur Analyse von Produktionskomponenten
Anmelder: General Electric Company 🇺🇸
Details
- Veröffentlichungs-Nr.
- EP2530460
- Aktenzeichen
- EP12169742
- Anmeldetag
- 29. Mai 2012
- Veröffentlichung
- 15. Januar 2020
- Erteilung
- 15. Januar 2020
- Rechtsraum
- EP
- IPC
- G01N27/00G01N29/30G01N29/44G01N21/93G01N23/00G01N29/04
Abstract
An engineering component (60) with a designed defect and use of an engineering component (60) with a designed defect to evaluate a production component are disclosed. A test component (70) having a known defect is manufactured. This known defect is a flaw that is intentionally included in the test component (70). The test component (70) is then analyzed to obtain a test profile (40) of the defect. In addition, the engineering component (60) to be tested is analyzed to obtain a production profile (40). This production profile (40) is compared with the test profile (40) to determine whether the engineering component (60) has a defect that corresponds to the known defect.
Anmelder
- Firma
- General Electric Company
- Land
- 🇺🇸 USA
US-amerikanischer Technologiekonzern mit Sitz in Massachusetts. Historisch aktiv in Energieerzeugung, Luftfahrttriebwerken, Medizintechnik und Industrietechnik über verschiedene Geschäftsbereiche.
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