Verfahren zur Erkennung eines LED-Ausfalls, Controller dafür, Beleuchtungseinheit und Beleuchtungssystem
Anmelder: NXP B.V. 🇳🇱
Details
- Veröffentlichungs-Nr.
- EP2717653
- Aktenzeichen
- EP12187154
- Anmeldetag
- 4. Oktober 2012
- Veröffentlichung
- 14. September 2016
- Erteilung
- 14. September 2016
- Rechtsraum
- EP
- IPC
- H05B33/08
Abstract
Disclosed herein is a method of detecting an LED failure in a series-connected string of LEDs using a parameter indicative of a voltage difference between a voltage across the string at a predetermined relatively high current and a voltage across the string at a predetermined relatively low current, wherein at both the relatively low current and the relatively high current levels the current through an un-failed LED is dominated by minority-carrier diffusion current, The method comprises: determining a calibration value of the parameter during a first start-up phase; storing the calibration value in a store; determining a subsequent value of the parameter during a subsequent measurement phase; and, in response to a difference between the calibration value and the subsequent value exceeding a threshold, determining that an LED failure has occurred. The disclose extends to controllers configured to detect an LED failure in a string of LEDs, to LED lighting units comprising such controllers, and to lighting subsystems, for instance automobile lighting subsystems, which include one or more such LED lighting units.
Anmelder
- Firma
- NXP B.V.
- Land
- 🇳🇱 Niederlande
Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.
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