Verfahren zur Erkennung eines LED-Ausfalls, Controller dafür, Beleuchtungseinheit und Beleuchtungssystem

EP2717653 Art B1 14. September 2016

Anmelder: NXP B.V. 🇳🇱

Details

Veröffentlichungs-Nr.
EP2717653
Aktenzeichen
EP12187154
Anmeldetag
4. Oktober 2012
Veröffentlichung
14. September 2016
Erteilung
14. September 2016
Rechtsraum
EP
IPC
H05B33/08
Offizieller Volltext

Abstract

Disclosed herein is a method of detecting an LED failure in a series-connected string of LEDs using a parameter indicative of a voltage difference between a voltage across the string at a predetermined relatively high current and a voltage across the string at a predetermined relatively low current, wherein at both the relatively low current and the relatively high current levels the current through an un-failed LED is dominated by minority-carrier diffusion current, The method comprises: determining a calibration value of the parameter during a first start-up phase; storing the calibration value in a store; determining a subsequent value of the parameter during a subsequent measurement phase; and, in response to a difference between the calibration value and the subsequent value exceeding a threshold, determining that an LED failure has occurred. The disclose extends to controllers configured to detect an LED failure in a string of LEDs, to LED lighting units comprising such controllers, and to lighting subsystems, for instance automobile lighting subsystems, which include one or more such LED lighting units.

Anmelder

Firma
NXP B.V.
Land
🇳🇱 Niederlande
🇳🇱 NXP Semiconductors

Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.

7.918 Patente in unserer Datenbank

Noch Fragen?

Wir helfen Ihnen gerne weiter. Schreiben Sie uns einfach.

Kontakt aufnehmen