Korrelatives optisches und Teilchenstrahlmikroskop
Anmelder: FEI COMPANY 🇺🇸
Details
- Veröffentlichungs-Nr.
- EP2899743
- Aktenzeichen
- EP14152582
- Anmeldetag
- 27. Januar 2014
- Veröffentlichung
- 21. September 2016
- Erteilung
- 21. September 2016
- Rechtsraum
- EP
- IPC
- H01J37/22H01J37/26
Abstract
The invention relates to a Correlative Light and Electron Microscope (CLEM), equipped with a TEM column and a light microscope (10), the light microscope fitting between the pole shoes (8A, 8B) of the objective lens of the TEM. To enlarge the acceptance solid angle for enhanced sensitivity a truncated lens is used. It is noted that this does not imply that the lens shows astigmatism (it is not a cylindrical lens). The invention further teaches to make, using the light microscope, a first image with the sample (1) in a first direction. This image will show in one direction a higher (diffraction limited) resolution than in the direction perpendicular thereto, due to the different NA of the lens in the two directions (312 x , 312 y ). By rotating the sample and make a second image, a combined image can be formed showing a better resolution than either of the images in the direction where they show a low NA.
Anmelder
- Firma
- FEI COMPANY
- Land
- 🇺🇸 USA
US-amerikanischer Hersteller von Elektronenmikroskopen und wissenschaftlichen Bildgebungssystemen, seit 2016 Teil von Thermo Fisher Scientific. Patente betreffen Elektronen- und Ionenmikroskopie sowie Materialanalyse.
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