Neuartige Datenverarbeitung in einer Tomographischen Bildgebungsvorrichtung

EP3133555 Art B1 10. April 2019

Anmelder: FEI Company 🇺🇸

Details

Veröffentlichungs-Nr.
EP3133555
Aktenzeichen
EP16180432
Anmeldetag
20. Juli 2016
Veröffentlichung
10. April 2019
Erteilung
10. April 2019
Rechtsraum
EP
IPC
G01N23/046G06T11/00
Offizieller Volltext

Abstract

A method of investigating a specimen (S) using a tomographic imaging apparatus comprising: - A specimen holder, for holding the specimen; - A source (Sx), for producing a beam (B) of radiation that can be directed at the specimen (S); - A detector (D), for detecting a flux of radiation transmitted through the specimen (S) from the source (Sx); - A stage apparatus (A), for producing relative motion of the source (Sx) with respect to the specimen (S), so as to allow the source (Sx) and detector (D) to image the specimen (S) along a series of different viewing axes (V<i>); - A processing apparatus, for performing a mathematical reconstruction step whereby output from the detector is compiled into a tomographic image of at least part of the specimen (S), wherein said reconstruction step is performed in multiple iterations, which comprise the following steps: (i) Using a Back Projection technique to produce an initial tomogram from a set of initial images; (ii) Subjecting said initial tomogram to a mathematical filtering operation, thereby producing an adjusted tomogram; (iii) Using a Forward Projection technique on said adjusted tomogram to dissociate it into a set of calculated images; (iv) Repeating steps (i)-(iii) until said calculated images satisfy an acceptance criterion. It is also provided a scanning electron microscope (1) including an in-situ computerised tomography (CT) module (7'') for performing CT inspection in-situ inside the chamber of the microscope (1).

Anmelder

Firma
FEI Company
Land
🇺🇸 USA
🇺🇸 FEI Company

US-amerikanischer Hersteller von Elektronenmikroskopen und wissenschaftlichen Bildgebungssystemen, seit 2016 Teil von Thermo Fisher Scientific. Patente betreffen Elektronen- und Ionenmikroskopie sowie Materialanalyse.

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