Infrarotdetektor mit Geringer Drift
Anmelder: Melexis Technologies NV 🇧🇪
Details
- Veröffentlichungs-Nr.
- EP3486623
- Aktenzeichen
- EP17202450
- Anmeldetag
- 17. November 2017
- Veröffentlichung
- 30. Oktober 2019
- Erteilung
- 30. Oktober 2019
- Rechtsraum
- EP
- IPC
- G01J5/12G01J5/02G01J5/06G01J5/22G01J5/00
Abstract
A semiconductor device (100) for measuring IR radiation comprising: at least one sensor pixel (10); at least one reference pixel (20) shielded from said IR radiation comprising a heater (23); a controller (50) adapted for: measuring a responsivity by applying power to the heater, while not heating the sensor pixel; measuring a first output signal of an unheated pixel and a first reference output signal of the heated pixel, obtaining the responsivity as a function of a measure of the applied power to the heater and of the difference between the first output signal and the first reference output signal; applying a period of cooling down until the temperature of the reference pixel and the sensor pixel are substantially the same; generating the output signal indicative of the IR radiation, based on the difference between the sensor and the reference output signal, by converting this difference using the responsivity.
Anmelder
- Firma
- Melexis Technologies NV
- Land
- 🇧🇪 Belgien
Halbleiterunternehmen mit belgischen Wurzeln und Schweizer Sitz, entwickelt integrierte Sensor- und Treiberschaltkreise für Automobil- und Industrieelektronik.
419 Patente in unserer Datenbank