Drahtgebundene Leistungshalbleitermodulüberwachung

Details

Veröffentlichungs-Nr.

EP3531146

Aktenzeichen

EP18305210

Anmeldetag

27. Februar 2018

Veröffentlichung

8. März 2023

Erteilung

8. März 2023

Rechtsraum

EP

IPC

G01R31/28// G01R31/70

Abstract

Method for estimating degradation of a wire-bonded power semi-conductor module (1) comprising:a) obtaining an indicator of degradation (Degr);b) estimating (11) an estimated indicator of degradation (Degr) by a temporal degradation model;c) obtaining (3) a set of on-line measure (X);then,d1) converting (13) the on-line measure (X) into a deducted indicator of degradation (Degr) by an electrical equivalence model, ande1) computing (15) a deviation between estimated and deducted indicator of degradation (Degr; Degr);and/ord2) converting (13) the estimated indicator of degradation (Degr) into a set of on-line estimation (X), ande2) computing (15) a deviation between set of on-line measure and estimation (X; X); andf) correcting (17) the estimated indicator of degradation (Degr) into a corrected estimated indicator of degradation (Degr) in function of the computed deviation.

Anmelder

Firmen

Mitsubishi Electric R&D Centre Europe B.V.
Mitsubishi Electric Corporation

Land

🇳🇱 Niederlande

Fachgebiete